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IIT 2006 houses the
IEEE Design and Test Workshop that is entirely devoted to presenting and
discussing trends, emerging results, hot topics, and practical applications in
the areas of VLSI design, test, reliability and fault tolerance.
The Workshop is sponsored by the
Dubai Silicon Oasis, the world's premier purpose-built
high-technology park for the microelectronics and the semiconductor industry.
The proceedings of the workshop are printed by the
IEEE Computer Society
Press.
IDT 2006 is an industry sponsored imitative to encourage combined
industry/research review of the state of the art and the state of the practice
in all aspects of integrated circuit design and testing. This forum aims
particularly at leveraging the trends of this technology across the Middle East
and Africa.
IDT 2006 brings users, implementers and researchers together to measure the
state of need against the state of the art, and to set an agenda for research
and deployment in order to incorporate VLSI design and testing techniques into
new and innovative applicationsFurther details about IDT Workshop and the
related submission procedure can be found in the
Workshop
website. |
Conference
IEEE IDT 2006
